Insights into the structure and self‐assembly of organic‐semiconductor/quantum‐dot blends

Toolan, D.T.W., Weir, M.P., Allardice, J. et al. (14 more authors) (2022) Insights into the structure and self‐assembly of organic‐semiconductor/quantum‐dot blends. Advanced Functional Materials, 32 (13). 2109252. ISSN 1616-301X

Abstract

Metadata

Authors/Creators:
  • Toolan, D.T.W.
  • Weir, M.P.
  • Allardice, J.
  • Smith, J.A.
  • Dowland, S.A.
  • Winkel, J.
  • Xiao, J.
  • Zhang, Z.
  • Gray, V.
  • Washington, A.L.
  • Petty, A.J.
  • Anthony, J.E.
  • Greenham, N.C.
  • Friend, R.H.
  • Rao, A.
  • Jones, R.A.L.
  • Ryan, A.J.
Copyright, Publisher and Additional Information: © 2021 The Authors. Advanced Functional Materials published by Wiley-VCH GmbH. This is an open access article under the terms of the Creative Commons Attribution License, (http://creativecommons.org/licenses/by/4.0/) which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
Keywords: energy materials; grazing incidence wide angle X-ray scattering; self-assembly; semiconductor nanocrystals; small-angle neutron scattering; thin films
Dates:
  • Published (online): 7 December 2021
  • Published: 23 March 2022
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Chemistry (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 14 Dec 2021 12:05
Last Modified: 07 Jul 2022 13:01
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1002/adfm.202109252

Share / Export

Statistics