Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Lim, J, Prestat, E, Carlsson, A et al. (4 more authors) (2020) Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study. Microscopy and Microanalysis, 26 (S2). pp. 394-395. ISSN 1431-9276

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Copyright, Publisher and Additional Information: This conference paper has been published in a revised form in Microscopy and Microanalysis [https://doi.org/10.1017/s1431927620014506] This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © Microscopy Society of America 2020.
Dates:
  • Published (online): 30 July 2020
  • Published: August 2020
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 11 Dec 2020 11:59
Last Modified: 30 Jan 2021 01:39
Status: Published
Publisher: Cambridge University Press (CUP)
Identification Number: https://doi.org/10.1017/s1431927620014506

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