Reducing dielectric loss in Na0.5Bi0.5TiO3 based high temperature capacitor material

Hoang, A.-P., Steiner, S., Yang, F. et al. (3 more authors) (2020) Reducing dielectric loss in Na0.5Bi0.5TiO3 based high temperature capacitor material. Journal of the European Ceramic Society. ISSN 0955-2219

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2020 Elsevier. This is an author produced version of a paper subsequently published in Journal of the European Ceramic Society. Uploaded in accordance with the publisher's self-archiving policy. Article available under the terms of the CC-BY-NC-ND licence (https://creativecommons.org/licenses/by-nc-nd/4.0/).
Keywords: High temperature capacitor; defect chemistry; dielectric loss; lead-free; NBT
Dates:
  • Accepted: 1 July 2020
  • Published (online): 13 November 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
Engineering and Physical Science Research CouncilEP/L027348/1
Depositing User: Symplectic Sheffield
Date Deposited: 08 Dec 2020 08:26
Last Modified: 08 Dec 2020 08:26
Status: Published online
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.jeurceramsoc.2020.07.005

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