Vibrational STEM-EELS of Single Si Atom Point Defects in Graphene

Hage, F, Radtke, G, Kepaptsoglou, D et al. (2 more authors) (2020) Vibrational STEM-EELS of Single Si Atom Point Defects in Graphene. In: Microscopy & Microanalysis 2020 Meeting, 04-07 Aug 2020, Online.

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Item Type: Conference or Workshop Item
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This article has been published in a revised form in Microscopy and Microanalysis https://doi.org/10.1017/S1431927620016463. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © Microscopy Society of America 2020.
Dates:
  • Published: 1 January 2020
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 03 Dec 2020 16:56
Last Modified: 30 Jan 2021 01:39
Status: Published
Identification Number: 10.1017/s1431927620016463
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