Preface for the special issue on Microscopy of Semiconducting Materials 2019

Walther, T. orcid.org/0000-0003-3571-6263, Calahorra, Y. and Massabuau, F. (2020) Preface for the special issue on Microscopy of Semiconducting Materials 2019. Semiconductor Science and Technology, 35 (12). 120201. ISSN 0268-1242

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2020 The Author(s). Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI (http://creativecommons.org/licenses/by/4.0/).
Dates:
  • Accepted: 9 September 2020
  • Published (online): 13 October 2020
  • Published: 13 October 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 23 Oct 2020 06:20
Last Modified: 24 Oct 2020 08:39
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6641/abb6b9

Export

Statistics


CORE (COnnecting REpositories)