Johnstone, DN, Firth, FCN, Grey, CP et al. (3 more authors) (2020) Direct imaging of correlated defect nanodomains in a metal-organic framework. Journal of the American Chemical Society. ISSN 0002-7863
Abstract
Defect engineering can enhance key properties of metal-organic frameworks (MOFs). Tailoring the distribution of de-fects, for example in correlated nanodomains, requires characterization across length scales. However, a critical na-noscale characterization gap has emerged between the bulk diffraction techniques used to detect defect nanodomains and the sub-nanometer imaging used to observe individual defects. Here, we demonstrate that the emerging technique of scanning electron diffraction (SED) can bridge this gap uniquely enabling both nanoscale crystallographic analysis and the low-dose formation of multiple diffraction contrast images for defect analysis in MOFs. We directly image defect nanodomains in the MOF UiO-66(Hf) over an area of ca. 1 000 nm and with a spatial resolution ca. 5 nm to reveal domain morphology and distribution. Based on these observations, we suggest possible crystal growth processes underpinning synthetic control of defect nanodomains. We also identify likely dislocations and small angle grain boundaries, illustrating that SED could be a key technique in developing the potential for engineering the distribution of defects, or “microstruc-ture”, in functional MOF design.
Metadata
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Dates: |
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Institution: | The University of Leeds |
Academic Units: | The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Chemical & Process Engineering (Leeds) |
Depositing User: | Symplectic Publications |
Date Deposited: | 15 Jul 2020 11:13 |
Last Modified: | 15 Jul 2020 11:13 |
Status: | Published online |
Publisher: | American Chemical Society (ACS) |
Identification Number: | https://doi.org/10.1021/jacs.0c04468 |