Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope

Trager-Cowan, C., Alasmari, A., Avis, W. et al. (34 more authors) (2020) Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope. Semiconductor Science and Technology. ISSN 0268-1242

Abstract

Metadata

Authors/Creators:
  • Trager-Cowan, C.
  • Alasmari, A.
  • Avis, W.
  • Bruckbauer, J.
  • Edwards, P.R.
  • Ferenczi, G.
  • Hourahine, B.
  • Kotzai, A.
  • Kraeusel, S.
  • Kusch, G.
  • Martin, R.W.
  • McDermott, R.
  • Gunasekar, N.
  • Nouf-Allehiani, M.
  • Pascal, E.
  • Thomson, D.
  • Vespucci, S.
  • Smith, M.D.
  • Parbrook, P.J.
  • Enslin, J.
  • Mehnke, F.
  • Kuhn, C.
  • Wernicke, T.
  • Kneissl, M.
  • Hagedorn, S.
  • Knauer, A.
  • Walde, S.
  • Weyers, M.
  • Coulon, P.-M.
  • Shields, P.
  • Bai, J.
  • Gong, Y.
  • Jiu, L.
  • Zhang, Y.
  • Smith, R. ORCID logo https://orcid.org/0000-0002-7718-7796
  • Wang, T. ORCID logo https://orcid.org/0000-0001-5976-4994
  • Winkelmann, A.
Copyright, Publisher and Additional Information: © 2020 The Author(s). Published by IOP Publishing Ltd. Available for reuse under a CC BY 3.0 licence (http://creativecommons.org/licenses/by/3.0).
Keywords: SEM; EBSD; ECCI; CL; nitride; extended defects
Dates:
  • Accepted: 12 February 2020
  • Published (online): 12 February 2020
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Funding Information:
FunderGrant number
Engineering and Physical Science Research CouncilEP/P006361/1; EP/P006973/1
Depositing User: Symplectic Sheffield
Date Deposited: 17 Mar 2020 11:32
Last Modified: 19 Mar 2020 04:40
Status: Published online
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6641/ab75a5

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