Importance-Driven Deep Learning System Testing

Gerasimou, Simos, Eniser, Hasan Ferit and Sen, Alper (2020) Importance-Driven Deep Learning System Testing. In: 42nd International Conference on Software Engineering. .

Abstract

Metadata

Authors/Creators:
  • Gerasimou, Simos (simos.gerasimou@york.ac.uk)
  • Eniser, Hasan Ferit
  • Sen, Alper
Dates:
  • Published: 2020
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Computer Science (York)
Depositing User: Pure (York)
Date Deposited: 10 Feb 2020 15:20
Last Modified: 17 Oct 2021 10:45
Status: Published
Refereed: No

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Filename: PID6349913.pdf

Description: ICSE2020.pdf

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