An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz

Clarke, RG orcid.org/0000-0002-4400-8464, Shang, X, Ridler, NM et al. (3 more authors) (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: Proceedings of the 94th ARFTG Microwave Measurement Symposium (ARFTG 2020). 94th ARFTG Microwave Measurement Symposium (ARFTG 2020), 26-29 Jan 2020, San Antonio, Texas, USA. IEEE . ISBN 978-1-7281-2056-0

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: On-wafer measurement; co-planar waveguide; measurement repeatability; measurement reproducibility; measurement uncertainty
Dates:
  • Accepted: 28 October 2019
  • Published (online): 20 April 2020
  • Published: 20 April 2020
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
FunderGrant number
European Association of National Metrology Institutes14IND02
Depositing User: Symplectic Publications
Date Deposited: 03 Feb 2020 12:54
Last Modified: 08 Jun 2020 14:58
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/ARFTG47584.2020.9071783

Export

Statistics


CORE (COnnecting REpositories)