Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers

Arz, U, Probst, T, Kuhlmann, K et al. (16 more authors) (2019) Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers. Report. Physikalisch-Technische Bundesanstalt (PTB)

Abstract

Metadata

Authors/Creators:
  • Arz, U
  • Probst, T
  • Kuhlmann, K
  • Ridler, N
  • Shang, X
  • Mubarak, F
  • Hoffmann, J
  • Wollensack, M
  • Zeier, M
  • Phung, GN
  • Heinrich, W
  • Lomakin, K
  • Gold, G
  • Helmreich, K
  • Lozar, R
  • Dambrine, G
  • Haddadi, K
  • Spirito, M
  • Clarke, R
Copyright, Publisher and Additional Information: This document and all parts contained therein are protected by copyright and are subject to the Creative Commons user license CC by 4.0 (https://creativecommons.org/licenses/by/4.0/).
Keywords: Calibration; on-wafer; S-parameters; traceability; uncertainty budget; coplanar waveguide (CPW); electromagnetic field simulation; parasitic modes; substrate modes; multiline-thru-reflect-line (mTRL); microwave probes; extreme impedance measurement; impedance mismatch; microwave interferometry; nanoelectronics; nanostructures; noise; vector network analyzer (VNA)
Dates:
  • Published: 24 April 2019
  • Accepted: 30 September 2018
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
FunderGrant number
EURAMET EMRP-MSU14IND02
Depositing User: Symplectic Publications
Date Deposited: 11 Nov 2019 10:54
Last Modified: 11 Nov 2019 10:54
Status: Published
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Identification Number: https://doi.org/10.7795/530.20190424B

Download

Share / Export

Statistics