Measurement of diffusion and segregation in semiconductor quantum dots and quantum wells by transmission electron microscopy : a guide

Walther, T. orcid.org/0000-0003-3571-6263 (2019) Measurement of diffusion and segregation in semiconductor quantum dots and quantum wells by transmission electron microscopy : a guide. Nanomaterials, 9 (6). 872.

Abstract

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Copyright, Publisher and Additional Information: © 2019 The Author. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Keywords: interdiffusion; segregation; quantum dots; quantum wells; electron microscopy
Dates:
  • Accepted: 4 June 2019
  • Published (online): 8 June 2019
  • Published: 8 June 2019
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 12 Aug 2019 11:54
Last Modified: 14 Aug 2019 04:31
Status: Published
Publisher: MDPI AG
Refereed: Yes
Identification Number: https://doi.org/10.3390/nano9060872
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