Phase-resolved terahertz self-detection near-field microscopy

Giordano, MC, Mastel, S, Liewald, C et al. (12 more authors) (2018) Phase-resolved terahertz self-detection near-field microscopy. Optics Express, 26 (14). pp. 18423-18435.

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2018 Optical Society of America. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.
Keywords: (180.4243) Near-field microscopy; (180.5810) Sca nning microscopy; (140.5965) Semiconductor lasers, quantum cascade; (110.6795) Terahertz imaging; (110.3175) Interferometric imaging; (310.6628) Subwavelength structures, nanostructures.
Dates:
  • Published: 9 July 2018
  • Accepted: 30 May 2018
  • Published (online): 3 July 2018
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
FunderGrant number
EPSRCEP/J017671/1
EPSRCEP/P021859/1
Depositing User: Symplectic Publications
Date Deposited: 12 Jul 2018 11:32
Last Modified: 01 Jul 2019 15:41
Status: Published
Publisher: Optical Society of America (OSA)
Identification Number: https://doi.org/10.1364/OE.26.018423

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