An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies

Clarke, RG, Li, C and Ridler, NM (2018) An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies. In: ARFTG Microwave Measurement Symposium (ARFTG), 2017 90th. ARFTG 90th Microwave Measurement Conference, 28 Nov - 01 Dec 2017, Boulder, CO, USA. IEEE . ISBN 978-1-5386-4356-3

Abstract

Metadata

Authors/Creators:
  • Clarke, RG
  • Li, C
  • Ridler, NM
Copyright, Publisher and Additional Information: (c) 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Measurement repeatability; Measurement reproducibility; On-wafer measurements; Millimeter-wave measurements; Measurement uncertainty
Dates:
  • Accepted: 16 October 2017
  • Published (online): 15 January 2018
  • Published: 15 January 2018
Institution: The University of Leeds
Funding Information:
FunderGrant number
EURAMET EMRP-MSU14IND02
Depositing User: Symplectic Publications
Date Deposited: 19 Dec 2017 09:32
Last Modified: 19 Apr 2018 08:18
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/ARFTG.2017.8255866

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