A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy

Nazarenko, M, Rosamond, MC, Gallant, AJ et al. (3 more authors) (2017) A simplified model to estimate thermal resistance between carbon nanotube and sample in scanning thermal microscopy. Journal of Physics D - Applied Physics, 50 (49). 494004. ISSN 1361-6463

Abstract

Metadata

Authors/Creators:
  • Nazarenko, M
  • Rosamond, MC
  • Gallant, AJ
  • Kolosov, OV
  • Dubrovskii, VG
  • Zeze, DA
Copyright, Publisher and Additional Information: © 2017 IOP Publishing Ltd. Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Keywords: scanning thermal microscopy (SThM), multiwalled carbon nanotubes (MWCNT), interfacial resistance, Kapitza thermal resistance, nanoscale resolution scanning thermal microscopy
Dates:
  • Published: 13 December 2017
  • Accepted: 29 September 2017
  • Published (online): 15 November 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 13 Dec 2017 09:55
Last Modified: 13 Dec 2017 09:55
Status: Published
Publisher: IOP Publishing
Identification Number: https://doi.org/10.1088/1361-6463/aa900e

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