Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX)

Walther, T. orcid.org/0000-0003-3571-6263 and Jones, L. (2017) Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX). Journal of Microscopy, 268 (3). pp. 221-224. ISSN 0022-2720

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Copyright, Publisher and Additional Information: © 2017 The Authors. This is an author produced version of a paper subsequently published in Journal of Microscopy. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Published (online): 20 November 2017
  • Published: December 2017
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 01 Dec 2017 12:39
Last Modified: 20 Nov 2018 01:38
Published Version: https://doi.org/10.1111/jmi.12665
Status: Published
Publisher: Wiley
Refereed: Yes
Identification Number: https://doi.org/10.1111/jmi.12665
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