Two-dimensional materials for improved resolution in total internal reflection fluorescence microscopy

Uddin, SZ and Talukder, MA orcid.org/0000-0002-2814-3658 (2017) Two-dimensional materials for improved resolution in total internal reflection fluorescence microscopy. Materials Research Express, 4 (9). 096203. ISSN 2053-1591

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Copyright, Publisher and Additional Information: © 2017 IOP Publishing Ltd. This is an author-created, un-copyedited version of an article published in Materials Research Express. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://doi.org/10.1088/2053-1591/aa8a0f. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: two-dimensional material, total internal reflection, fluorescence microscopy
Dates:
  • Published: 28 September 2017
  • Accepted: 4 September 2017
  • Published (online): 4 September 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 17 Nov 2017 16:03
Last Modified: 04 Sep 2018 00:38
Status: Published
Publisher: IOP Publishing
Identification Number: https://doi.org/10.1088/2053-1591/aa8a0f
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