Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry

Keeley, JT, Freeman, JR, Bertling, K et al. (9 more authors) (2017) Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry. Scientific Reports, 7. 7236. ISSN 2045-2322



Copyright, Publisher and Additional Information: (c) 2017 Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit
  • Accepted: 28 June 2017
  • Published (online): 3 August 2017
  • Published: 3 August 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
FunderGrant number
EU - European UnionCGA-BM1205-1
Royal SocietyWM110032
Royal SocietyWM150029
Depositing User: Symplectic Publications
Date Deposited: 04 Aug 2017 11:13
Last Modified: 16 Jan 2018 05:52
Status: Published
Publisher: Nature Publishing Group
Identification Number:
Related URLs:

Share / Export