Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

Naftaly, M, Clarke, RG, Humphreys, DA et al. (1 more author) (2017) Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements. Proceedings of the IEEE, PP (99). pp. 1-15. ISSN 0018-9219

Abstract

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Authors/Creators:
  • Naftaly, M
  • Clarke, RG
  • Humphreys, DA
  • Ridler, NM
Copyright, Publisher and Additional Information: © 2017 IEEE. This is an author produced version of a paper published in Proceedings of the IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: vector network analyzers, Electro-optic sampling, metrology, submillimeter waves, terahertz, time-domain spectrometers
Dates:
  • Published: 23 January 2017
  • Accepted: 19 December 2016
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 21 Mar 2017 11:02
Last Modified: 19 Jan 2018 12:14
Published Version: https://doi.org/10.1109/JPROC.2016.2644108
Status: Published
Publisher: IEEE
Identification Number: https://doi.org/10.1109/JPROC.2016.2644108

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