Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements

Naftaly, M, Clarke, RG, Humphreys, DA et al. (1 more author) (2017) Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements. Proceedings of the IEEE, PP (99). pp. 1-15. ISSN 0018-9219



  • Naftaly, M
  • Clarke, RG
  • Humphreys, DA
  • Ridler, NM
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Keywords: vector network analyzers, Electro-optic sampling, metrology, submillimeter waves, terahertz, time-domain spectrometers
  • Accepted: 19 December 2016
  • Published: 23 January 2017
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 21 Mar 2017 11:02
Last Modified: 19 Jan 2018 12:14
Published Version:
Status: Published
Publisher: IEEE
Identification Number: