A new method for the precise multiband microwave dielectric measurement using stepped impedance stub

Sandhu, M, Ali, A, Hunter, IC orcid.org/0000-0002-4246-6971 et al. (1 more author) (2016) A new method for the precise multiband microwave dielectric measurement using stepped impedance stub. Measurement Science and Technology, 27 (11). 117001. ISSN 0957-0233

Abstract

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Authors/Creators:
Copyright, Publisher and Additional Information: © 2016 IOP Publishing Ltd. This is an author produced version of a paper published in Measurement Science and Technology. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Dielectric properties, loss factor, Microwave dielectric spectroscopy, wideband dielectric characterization
Dates:
  • Published: 22 September 2016
  • Accepted: 26 August 2016
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering & Physical Sciences (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Funding Information:
FunderGrant number
Innovate UK fka Technology Strategy Board (TSB)31587-233189
Depositing User: Symplectic Publications
Date Deposited: 15 Sep 2016 10:18
Last Modified: 28 Sep 2017 11:17
Published Version: https://doi.org/10.1088/0957-0233/27/11/117001
Status: Published
Publisher: IOP Publishing
Identification Number: https://doi.org/10.1088/0957-0233/27/11/117001

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