Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

Zhou, Y., Fox, D.S., Maguire, P. et al. (7 more authors) (2016) Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene. SCIENTIFIC REPORTS, 6. ARTN 21045. ISSN 2045-2322

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Dates:
  • Accepted: 25 November 2016
  • Published: 16 February 2016
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ROYAL SOCIETYIE140211
LEVERHULME TRUST (THE)VP1-2014-011
Depositing User: Symplectic Sheffield
Date Deposited: 14 Jul 2016 13:25
Last Modified: 14 Jul 2016 13:25
Published Version: http://dx.doi.org/10.1038/srep21045
Status: Published
Publisher: Nature Publishing Group
Refereed: Yes
Identification Number: https://doi.org/10.1038/srep21045
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