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Article

Zhu, C. orcid.org/0000-0002-5516-661X, Hobbs, M.J., Masters, R.C. et al. (2 more authors) (2019) An accurate device for apparent emissivity characterisation in controlled atmospheric conditions up to 1423 K. IEEE Transactions on Instrumentation and Measurement. ISSN 0018-9456

Zhu, C. orcid.org/0000-0002-5516-661X, Hobbs, M.J., Grainger, M.P. et al. (1 more author) (2018) Design and realization of a wide field of view infrared scanning system with an integrated micro-electromechanical system mirror. Applied Optics, 57 (36). pp. 10449-10457. ISSN 0003-6935

Cai, Y. orcid.org/0000-0002-2004-0881, Zhu, C., Jiu, L. et al. (5 more authors) (2018) Strain Analysis of GaN HEMTs on (111) Silicon with Two Transitional AlxGa1-xN Layers. Materials, 11 (10). 1968. ISSN 1996-1944

Hobbs, M. orcid.org/0000-0003-4661-692X, Zhu, C., Grainger, M. et al. (2 more authors) (2018) Quantitative traceable temperature measurement using novel thermal imaging camera. Optics Express, 26 (19). 24904-24916. ISSN 1094-4087

Boone, N.A. orcid.org/0000-0002-5251-0104, Zhu, C., Smith, C. et al. (2 more authors) (2018) Thermal near infrared monitoring system for electron beam melting with emissivity tracking. Additive Manufacturing, 22. pp. 601-605. ISSN 2214-8604

Hobbs, M.J., Grainger, M.P., Zhu, C. et al. (2 more authors) (2018) Quantitative thermal imaging using single-pixel Si APD and MEMS mirror. Optics Express, 26 (3). pp. 3188-3198. ISSN 1094-4087

This list was generated on Sun Oct 13 17:20:19 2019 BST.