Direct Identification of Monolayer Rhenium Diselenide by an Individual Diffraction Pattern

Fei, Zhen, Wang, Bo, Ho, Ching-Hwa et al. (4 more authors) (2017) Direct Identification of Monolayer Rhenium Diselenide by an Individual Diffraction Pattern. Nano Research. ISSN 1998-0124

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Copyright, Publisher and Additional Information: This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details
Dates:
  • Published (online): 19 May 2017
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Physics (York)
Depositing User: Pure (York)
Date Deposited: 07 Jun 2017 09:15
Last Modified: 05 Jan 2020 05:16
Published Version: https://doi.org/10.1007/s12274-017-1639-7
Status: Published online
Refereed: Yes
Identification Number: https://doi.org/10.1007/s12274-017-1639-7
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