Electromagnetic Monitoring of Semiconductor Ageing

Duffy, A.P., Dawson, J.F. orcid.org/0000-0003-4537-9977, Flintoft, I.D. orcid.org/0000-0003-3153-8447 et al. (1 more author) (2014) Electromagnetic Monitoring of Semiconductor Ageing. Procedia CIRP. 98 - 102. ISSN 2212-8271

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Authors/Creators:
Copyright, Publisher and Additional Information: © Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services
Keywords: Intermodulation,Electromagnetic Compatibility,Semiconductor Ageing,Failure prediction,Through life monitoring
Dates:
  • Published: 2014
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 15 Dec 2015 11:42
Last Modified: 13 Nov 2019 09:44
Published Version: https://doi.org/10.1016/j.procir.2014.07.130
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.procir.2014.07.130

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Description: Electromagnetic Monitoring of Semiconductor Ageing

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