Duffy, A.P., Dawson, J.F. orcid.org/0000-0003-4537-9977, Flintoft, I.D. orcid.org/0000-0003-3153-8447 et al. (1 more author) (2014) Electromagnetic Monitoring of Semiconductor Ageing. Procedia CIRP. 98 - 102. ISSN 2212-8271
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Item Type: | Article | ||||
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Copyright, Publisher and Additional Information: | © Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services | ||||
Keywords: | Intermodulation, Electromagnetic Compatibility, Semiconductor Ageing, Failure prediction, Through life monitoring | ||||
Dates: |
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Institution: | The University of York | ||||
Academic Units: | The University of York > Faculty of Sciences (York) > Electronic Engineering (York) | ||||
Funding Information: |
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Depositing User: | Pure (York) | ||||
Date Deposited: | 15 Dec 2015 11:42 | ||||
Last Modified: | 06 Mar 2024 00:09 | ||||
Published Version: | https://doi.org/10.1016/j.procir.2014.07.130 | ||||
Status: | Published | ||||
Refereed: | Yes | ||||
Identification Number: | https://doi.org/10.1016/j.procir.2014.07.130 |
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Description: Electromagnetic Monitoring of Semiconductor Ageing