A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance

Robinson, M.P., Flintoft, I.D. orcid.org/0000-0003-3153-8447, Marvin, A.C. orcid.org/0000-0003-2590-5335 et al. (1 more author) (2003) A simple model of EMI-induced timing jitter in digital circuits, its statistical distribution and its effect on circuit performance. IEEE Transactions on Electromagnetic Compatibility. pp. 513-519. ISSN 0018-9375

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Copyright, Publisher and Additional Information: © 2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: digital circuits,immunity,jitter,radio frequency interference (RFI),statistical distribution,timing delays,PREDICTION,SYSTEMS
Institution: The University of York
Academic Units: The University of York > Electronics (York)
Depositing User: Sherpa Assistant
Date Deposited: 16 Sep 2005
Last Modified: 27 Nov 2016 02:26
Published Version: http://dx.doi.org/10.1109/TEMC.2003.815529
Status: Published
Refereed: Yes

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