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Tomographic imaging and scanning thermal microscopy: thermal impedance tomography

Smallwood, R.H. [r.smallwood@shef.ac.uk], Metherall, P., Hose, D., Delves, M., Pollock, H., Hammiche, A., Hodges, C., Mathot, V. and Willcocks, P. (2002) Tomographic imaging and scanning thermal microscopy: thermal impedance tomography. Thermochimica Acta, 385 (1-2). pp. 19-32. ISSN 0040-6031

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Abstract

The application of tomographic imaging techniques developed for medical applications to the data provided by the scanning thermal microscope will give access to true three-dimensional information on the thermal properties of materials on a mm length scale. In principle, the technique involves calculating and inverting a sensitivity matrix for a uniform isotropic material, collecting ordered data at several modulation frequencies, and multiplying the inverse of the matrix with the data vector. In practice, inversion of the matrix in impractical, and a novel iterative technique is used. Examples from both simulated and real data are given.

Item Type: Article
Copyright, Publisher and Additional Information: Copyright © 2002 Elsevier Science B.V. All rights reserved. For further information, see http://www.dcs.shef.ac.uk/~rod/
Keywords: scanning thermal microscopy; tomographic imaging; sensitivity matrix; polymers
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Computer Science (Sheffield)
Depositing User: Rod Smallwood
Date Deposited: 28 Apr 2005
Last Modified: 08 Feb 2013 16:47
Published Version: http://dx.doi.org/10.1016/S0040-6031(01)00705-5
Status: Published
Refereed: Yes
Identification Number: 10.1016/S0040-6031(01)00705-5
URI: http://eprints.whiterose.ac.uk/id/eprint/423

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