Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films

Trager-Cowan, C., Alasmari, A., Avis, W. et al. (33 more authors) (2019) Scanning electron microscope as a flexible tool for investigating the properties of UV-emitting nitride semiconductor thin films. Photonics Research, 7 (11). B73-B82.

Abstract

Metadata

Authors/Creators:
  • Trager-Cowan, C.
  • Alasmari, A.
  • Avis, W.
  • Bruckbauer, J.
  • Edwards, P.R.
  • Hourahine, B.
  • Kraeusel, S.
  • Kusch, G.
  • Johnston, R.
  • Naresh-Kumar, G.
  • Martin, R.W.
  • Nouf-Allehiani, M.
  • Pascal, E.
  • Spasevski, L.
  • Thomson, D.
  • Vespucci, S.
  • Parbrook, P.J.
  • Smith, M.D.
  • Enslin, J.
  • Mehnke, F.
  • Kneissl, M.
  • Kuhn, C.
  • Wernicke, T.
  • Hagedorn, S.
  • Knauer, A.
  • Kueller, V.
  • Walde, S.
  • Weyers, M.
  • Coulon, P.M.
  • Shields, P.A.
  • Zhang, Y.
  • Jiu, L.
  • Gong, Y.
  • Smith, R.M.
  • Wang, T. https://orcid.org/0000-0001-5976-4994
  • Winkelmann, A.
Copyright, Publisher and Additional Information: © 2019 The Authors. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License (https://creativecommons.org/licenses/by/4.0/). Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
Dates:
  • Accepted: 28 August 2019
  • Published: 30 October 2019
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Funding Information:
FunderGrant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/M003132/1
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/M015181/1
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/P006973/1
Depositing User: Symplectic Sheffield
Date Deposited: 18 Nov 2019 13:20
Last Modified: 18 Nov 2019 13:20
Status: Published
Publisher: The Optical Society
Refereed: Yes
Identification Number: https://doi.org/10.1364/prj.7.000b73

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