Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

Walther, T. orcid.org/0000-0003-3571-6263 (2019) Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM). In: Journal of Physics: Conference Series. 19th International Conference on Extended Defects in Semiconductors (EDS2018), 24-29 Jun 2018, Thessaloniki, Greece. IOP Publishing .

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Copyright, Publisher and Additional Information: © IOP Publishing. Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence (https://creativecommons.org/licenses/by/3.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Published under licence by IOP Publishing Ltd.
Dates:
  • Published (online): 23 May 2019
  • Published: 23 May 2019
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 10 Jun 2019 11:26
Last Modified: 11 Jun 2019 15:32
Status: Published
Publisher: IOP Publishing
Refereed: Yes
Identification Number: https://doi.org/10.1088/1742-6596/1190/1/012002

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