A Bayesian framework to estimate part quality and associated uncertainties in multistage manufacturing

Papananias, M., McLeay, T.E., Mahfouf, M. orcid.org/0000-0002-7349-5396 et al. (1 more author) (2019) A Bayesian framework to estimate part quality and associated uncertainties in multistage manufacturing. Computers in Industry, 105. pp. 35-47. ISSN 0166-3615

Abstract

Metadata

Authors/Creators:
Copyright, Publisher and Additional Information: © 2018 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
Keywords: Multistage Manufacturing Process (MMP); Bayesian inference; Regression; ANOVA; Metrology informatics; Measurement uncertainty
Dates:
  • Accepted: 30 October 2018
  • Published (online): 22 February 2019
  • Published: February 2019
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Automatic Control and Systems Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 06 Mar 2019 15:12
Last Modified: 06 Mar 2019 15:12
Published Version: https://doi.org/10.1016/j.compind.2018.10.008
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: https://doi.org/10.1016/j.compind.2018.10.008

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