Exchange bias induced at a Co2FeAl0.5Si0.5/Cr interface

Yu, Chris Nga Tung, Vick, Andrew James, Inami, Nobuhito et al. (3 more authors) (2017) Exchange bias induced at a Co2FeAl0.5Si0.5/Cr interface. Journal of Physics D: Applied Physics. 125004. pp. 1-6. ISSN 1361-6463

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Copyright, Publisher and Additional Information: © 2017 The Author(s).
Dates:
  • Published: 27 February 2017
Institution: The University of York
Academic Units: The University of York > Faculty of Sciences (York) > Electronic Engineering (York)
Depositing User: Pure (York)
Date Deposited: 12 Apr 2017 16:00
Last Modified: 19 Jul 2019 23:28
Published Version: https://doi.org/10.1088/1361-6463/aa560d
Status: Published
Refereed: Yes
Identification Number: https://doi.org/10.1088/1361-6463/aa560d

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