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Cross, R.B.M., De Souza, M.M., Deane, S.C. et al. (1 more author) (2008) A comparison of the performance and stability of ZnO-TFTs with silicon dioxide and nitride as gate insulators. IEEE Transactions on electron devices, 55 (5). pp. 1109-1115. ISSN 0018-9383

This list was generated on Sun Oct 13 10:52:29 2019 BST.