Items where authors include "Tobias, S"
Article
Smedt, K, Ruprecht, D, Niesen, J orcid.org/0000-0002-6693-3810 et al. (2 more authors) (2023) New applications for the Boris Spectral Deferred Correction algorithm for plasma simulations. Applied Mathematics and Computation, 442. 127706. ISSN 0096-3003
Cantarello, L orcid.org/0000-0002-1005-8463, Bokhove, O and Tobias, S (2022) An Idealized 1½-Layer Isentropic Model with Convection and Precipitation for Satellite Data Assimilation Research. Part I: Model Dynamics. Journal of the Atmospheric Sciences, 79 (3). pp. 859-873. ISSN 0022-4928
Bokhove, O, Cantarello, L orcid.org/0000-0002-1005-8463 and Tobias, S (2022) An Idealized 1½-Layer Isentropic Model with Convection and Precipitation for Satellite Data Assimilation Research. Part II: Model Derivation. Journal of the Atmospheric Sciences, 79 (3). pp. 875-886. ISSN 0022-4928
Clarke, A, Davies, C orcid.org/0000-0002-1074-3815, Ruprecht, D et al. (2 more authors) (2020) Performance of parallel-in-time integration for Rayleigh Bénard convection. Computing and Visualization in Science, 23 (1-4). 10. ISSN 1432-9360
Kent, T, Bokhove, O and Tobias, S (2017) Dynamics of an Idealized Fluid Model for Investigating Convective-scale Data Assimilation. Tellus A: Dynamic Meteorology and Oceanography, 69 (1). 1369332. ISSN 0280-6495
Child, A, Hollerbach, R, Marston, B et al. (1 more author) (2016) Generalised quasilinear approximation of the helical magnetorotational instability. Journal of Plasma Physics, 82 (3). 905820302. ISSN 0022-3778
Monograph
Juniper, M orcid.org/0000-0002-8742-9541, Noakes, C orcid.org/0000-0003-3084-7467, Tobias, S orcid.org/0000-0003-0205-7716 et al. (2 more authors) (2021) Our Fluid Nation: The Impact of Fluid Dynamics in the UK. Report. University of Leeds
Proceedings Paper
Arter, W, Osojnik, A, Cartis, C et al. (3 more authors) (2018) Data assimilation approach to analysing systems of ordinary differential equations. In: 2018 IEEE International Symposium on Circuits and Systems (ISCAS). 2018 IEEE ISCAS, 27-30 May 2018, Florence, Italy. IEEE . ISBN 978-1-5386-4881-0