Items where authors include "Sharpe, M.K."

Article

Sharpe, M.K., Marko, I.P., Duffy, D.A. et al. (7 more authors) (2019) A comparative study of epitaxial InGaAsBi/InP structures using Rutherford backscattering spectrometry, X-ray diffraction and photoluminescence techniques. Journal of Applied Physics, 126 (12). 125706. ISSN 0021-8979