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Hou, H., Chung, Y., Rughoobur, G. et al. (7 more authors) (2018) Experimental verification of electrostatic boundary conditions in gate-patterned quantum devices. Journal of Physics D: Applied Physics, 51 (24). 244004. ISSN 0022-3727

This list was generated on Sun Aug 18 13:26:50 2019 BST.