Items where authors include "Rittidech, A."

Article

Daeng-Am, W., Chureemart, P., Rittidech, A. et al. (3 more authors) (2020) Micromagnetic model of exchange bias : Effects of structure and AF easy axis dispersion for IrMn/CoFe bilayers. Journal of Physics D: Applied Physics. 045002. ISSN 0022-3727