Items where authors include "Nguyen, T.-S."
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Article
Do, H.-B. orcid.org/0000-0003-3274-5050, Luc, Q.-H., Pham, P.V. et al. (4 more authors) (2023) Metal-induced trap states: the roles of interface and border traps in HfO2/InGaAs. Micromachines, 14 (8). 1606. ISSN 2072-666X