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Goh, Y.L., Ng, J.S., Tan, C.H. et al. (2 more authors) (2005) Excess noise measurement in In0.53Ga0.47As. IEEE Photonics Technology Letters, 17 (11). pp. 2412-2414. ISSN 1041-1135

Yee, M., Ng, W.K., David, J.P.R. et al. (3 more authors) (2003) Temperature dependence of breakdown and avalanche multiplication in In0.53Ga0.47As diodes and heterojunction bipolar transistors. IEEE Transactions on Electron Devices, 50 (10). pp. 2021-2026. ISSN 0018-9383

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