Items where authors include "McMinn, P."

Article

Parry, O. orcid.org/0000-0002-0917-1274, Kapfhammer, G.M., Hilton, M. et al. (1 more author) (2023) Empirically evaluating flaky test detection techniques combining test case rerunning and machine learning models. Empirical Software Engineering, 28. 72. ISSN 1382-3256

Althomali, I., Kapfhammer, G.M. and McMinn, P. orcid.org/0000-0001-9137-7433 (2021) Automated visual classification of DOM-based presentation failure reports for responsive web pages. Software Testing, Verification and Reliability, 31 (4). e1756. ISSN 0960-0833

Mahajan, S., Alameer, A., McMinn, P. orcid.org/0000-0001-9137-7433 et al. (1 more author) (2021) Effective automated repair of internationalization presentation failures in web applications using style similarity clustering and search‐based techniques. Software Testing, Verification and Reliability, 31 (10-2). e1746. ISSN 0960-0833

Walsh, T.A., Kapfhammer, G.M. and McMinn, P. orcid.org/0000-0001-9137-7433 (2020) Automatically identifying potential regressions in the layout of responsive web pages. Software Testing, Verification and Reliability, 30 (6). e1748. ISSN 0960-0833

Hall, M., Walkinshaw, N. and McMinn, P. (2018) Effectively incorporating expert knowledge in automated software remodularisation. IEEE Transactions on Software Engineering, 44 (7). pp. 613-630. ISSN 0098-5589

McMinn, P., Wright, C.J. and Kapfhammer, G.M. (2015) The Effectiveness of Test Coverage Criteria for Relational Database Schema Integrity Constraints. ACM Transactions on Software Engineering and Methodology , 25 (1). 8. ISSN 1049-331X

Kempka, J., McMinn, P. and Sudholt, D. (2015) Design and analysis of different alternating variable searches for search-based software testing. Theoretical Computer Science, 605. pp. 1-20. ISSN 0304-3975

Fraser, G., Staats, M., McMinn, P. et al. (2 more authors) (2015) Does Automated Unit Test Generation Really Help Software Testers? A Controlled Empirical Study. ACM Transactions on Software Engineering and Methodology, 24 (4). 23. ISSN 1049-331X

Fraser, G., McMinn, P. and Arcuri, A. (2014) A Memetic Algorithm for whole test suite generation. Journal of Systems and Software. ISSN 0164-1212

Fraser, G., Arcuri, A. and McMinn, P. (2014) A Memetic Algorithm for whole test suite generation. Journal of Systems and Software, 103. 311 - 327. ISSN 0164-1212

Fraser, G., McMinn, P., Staats, M. et al. (2 more authors) (2013) Does automated white-box test generation really help software testers? 2013 International Symposium on Software Testing and Analysis, ISSTA 2013 - Proceedings. 291 - 301.

Lakhotia, K., McMinn, P. and Harman, M. (2010) An empirical investigation into branch coverage for C programs using CUTE and AUSTIN. Journal of Systems and Software, 83 (12). pp. 2379-2391. ISSN 0164-1212

Sun, T., McMinn, P., Holcombe, M. et al. (2 more authors) (2008) Agent based modelling helps in understanding the rules by which fibroblasts support keratinocyte colony formation. Plos One , 3 (5). Art No.e2129. ISSN 1932-6203

Proceedings Paper

Gruber, M., Roslan, M.F., Parry, O. et al. (3 more authors) (2024) Do automatic test generation tools generate flaky tests? In: ICSE '24: Proceedings of the 46th IEEE/ACM International Conference on Software Engineering. 46th International Conference on Software Engineering (ICSE 2024), 14-20 Apr 2024, Lisbon, Portugal. Association for Computing Machinery (ACM) , New York, NY, United States . ISBN 9798400702174

Clegg, B., Villa-Uriol, M.-C., McMinn, P. et al. (1 more author) (2021) Gradeer : an open-source modular hybrid grader. In: 2021 IEEE/ACM 43rd International Conference on Software Engineering: Software Engineering Education and Training (ICSE-SEET). 43rd International Conference on Software Engineering: Software Engineering Education and Training (ICSE 21), 25-28 May 2021, Virtual conference. IEEE (Institute of Electrical and Electronics Engineers) , pp. 60-65. ISBN 9781665401388

Binkley, D., Glenn, J., Alsharif, A. et al. (1 more author) (2020) An investigation into the effect of control and data dependence paths on predicate testability. In: Proceedings of 2020 IEEE 20th International Working Conference on Source Code Analysis and Manipulation (SCAM). 2020 IEEE 20th International Working Conference on Source Code Analysis and Manipulation (SCAM), 28 Sep - 02 Oct 2020, Adelaide, Australia. IEEE , pp. 160-170. ISBN 9781728192499

Alsharif, A., Kapfhammer, G.M. and McMinn, P. orcid.org/0000-0001-9137-7433 (2019) What factors make SQL test cases understandable for testers? A human study of automated test data generation techniques. In: 2019 IEEE International Conference on Software Maintenance and Evolution (ICSME). 2019 IEEE International Conference on Software Maintenance and Evolution (ICSME), 30 Sep - 04 Oct 2019, Cleveland, OH, USA. IEEE , pp. 437-448. ISBN 9781728130958

Clegg, B., North, S. orcid.org/0000-0002-8478-8960, McMinn, P. orcid.org/0000-0001-9137-7433 et al. (1 more author) (2019) Simulating student mistakes to evaluate the fairness of automated grading. In: 2019 IEEE/ACM 41st International Conference on Software Engineering: Software Engineering Education and Training (ICSE-SEET). 41st International Conference on Software Engineering: Software Engineering Education and Training (ICSE-SEET), 25-31 May 2019, Montreal, QC, Canada. IEEE , pp. 121-125. ISBN 9781728110011

Paterson, D., Campos, J., Abreu, R. et al. (3 more authors) (2019) An empirical study on the use of defect prediction for test case prioritization. In: 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST). 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), 22-27 Apr 2019, Xian, China. IEEE , pp. 346-357. ISBN 9781728117379

Baars, A.I., Harman, M., Hassoun, Y. et al. (4 more authors) (2011) Symbolic search-based testing. In: Alexander, P., Pasareanu, C.S. and Hosking, J.G., (eds.) Proceedings of 2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011). 2011 26th IEEE/ACM International Conference on Automated Software Engineering (ASE 2011), 06-10 Nov 2011, Lawrence, KS, USA. IEEE , pp. 53-62. ISBN 978-1-4577-1638-6