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Scannell, B.C., Pilgrim, I., See, A.M. et al. (11 more authors) (2012) Probing the sensitivity of electron wave interference to disorder-induced scattering in solid-state devices. Physical Review B , 85. 195319 . ISSN 1098-0121

This list was generated on Sat Jun 27 18:04:43 2020 BST.