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Article

Jackson, Edward Alan, Wu, Yifan, Frost, William James et al. (9 more authors) (2019) Non-destructive imaging for quality assurance of magnetoresistive random-access memory junctions. Journal of Physics D: Applied Physics. 014004. ISSN 1361-6463

Ichinose, Tomohiro, Elphick, Kelvin, Hirohata, Atsufumi orcid.org/0000-0001-9107-2330 et al. (1 more author) (2019) Tunnel Magnetoresistance in the Magnetic Tunnel Junctions with an Amorphous Boron Nitride Barrier Formed via Nitrogen Diffusion. ACS Applied Electronic Materials.

Tsuchiya, Tomoki, Roy, Tufan, Elphick, Kelvin et al. (8 more authors) (2019) Magnetic tunnel junctions with a B2-ordered CoFeCrAl equiatomic Heusler alloy. PHYSICAL REVIEW MATERIALS. 084403. ISSN 2475-9953

Kunimatsu, Kazuma, Tsuchiya, Tomoki, Elphick, Kelvin et al. (4 more authors) (2019) Fabrication of magnetic tunnel junctions with a metastable bcc Co3Mn disordered alloy as a bottom electrode. Japanese Journal of Applied Physics. 080908. ISSN 1347-4065

This list was generated on Sun Aug 9 08:12:13 2020 BST.