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Gelsthorpe, A. and El-Gomati, M.M. (2003) Identification of artefacts in Auger electron spectroscopy due to surface topography. Journal of Vacuum Science and Technology B, 21 (2). pp. 744-747. ISSN 1071-1023

El-Gomati, M.M. and Wells, T.C.R. (2001) Very-low-energy electron microscopy of doped semiconductors. Applied Physics Letters, 79 (18). 2931-2933.. ISSN 0003-6951

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