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Article

Baggott, A., Mazaheri, M. and Inkson, B.J. orcid.org/0000-0002-2631-9090 (2019) 3D characterisation of indentation induced sub-surface cracking in silicon nitride using FIB tomography. Journal of the European Ceramic Society, 39 (13). pp. 3620-3626. ISSN 0955-2219

Baggott, A., Mazaheri, M., Zhou, Y. et al. (2 more authors) (2018) A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride. Materials Characterization, 141. pp. 362-369. ISSN 1044-5803

This list was generated on Sun Aug 18 18:24:14 2019 BST.