Items where Funder is SKF B.V..

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Jump to: IN-2016-027 | URMS 145478
Number of items: 2.

IN-2016-027

Baggott, A., Mazaheri, M., Zhou, Y. et al. (2 more authors) (2018) A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride. Materials Characterization, 141. pp. 362-369. ISSN 1044-5803

URMS 145478

Baggott, A., Mazaheri, M., Zhou, Y. et al. (2 more authors) (2018) A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride. Materials Characterization, 141. pp. 362-369. ISSN 1044-5803

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