Nair, S.S., Patel, V.I. and Wang, J. orcid.org/0000-0003-4870-3744 (2016) Post-Demagnetization Performance Assessment for Interior Permanent Magnet AC Machines. IEEE Transactions on Magnetics, 52 (4). 8102810. ISSN 0018-9464
Abstract
This paper assesses the post-demagnetization performance of interior permanent magnet (IPM) ac machines by employing the more accurate recoil line approach based on a 2-D transient finite-element analysis (FEA). The method predicts continuous demagnetization of each magnet element undergoing partial demagnetization and evaluates the machine behavior after an event of short-circuit faults across its terminals. Along with the short-circuit faults, a failure in a drive controller or a position sensor, which may lead to a reverse voltage across the machine terminals that can eventually be more fatal and can cause significant reduction in the performance due to high levels of demagnetization, is analyzed as the worst case scenario. The FE predicted post-demagnetization performance is validated by experimental measurements in which a six-phase IPM machine designed for electric vehicle traction is allowed to lose its synchronization with the inverter when forced to operate on a torque-speed envelope, which is way beyond the drive voltage setting.
Metadata
Item Type: | Article |
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Authors/Creators: |
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Copyright, Publisher and Additional Information: | © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. Reproduced in accordance with the publisher's self-archiving policy. |
Keywords: | Field weakening; finite-element analysis; interior permanent magnet; inverter failure; partial demagnetization; short-circuit faults |
Dates: |
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Institution: | The University of Sheffield |
Academic Units: | The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield) |
Depositing User: | Symplectic Sheffield |
Date Deposited: | 04 May 2016 10:29 |
Last Modified: | 22 Mar 2018 03:06 |
Published Version: | http://dx.doi.org/10.1109/TMAG.2015.2505245 |
Status: | Published |
Publisher: | Institute of Electrical and Electronics Engineers |
Refereed: | Yes |
Identification Number: | 10.1109/TMAG.2015.2505245 |
Related URLs: | |
Open Archives Initiative ID (OAI ID): | oai:eprints.whiterose.ac.uk:99269 |