Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging

Humphry, M.J., Kraus, B., Hurst, A.C. et al. (2 more authors) (2012) Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging. Nature Communications, 3. ARTN 730.

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Copyright, Publisher and Additional Information: © 2011 Macmillan Publishers Limited. All rights reserved. This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/
Keywords: Physical sciences; Applied physics; Optical physics
Dates:
  • Published: 6 March 2012
  • Accepted: 6 February 2012
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 08 Aug 2016 11:40
Last Modified: 08 Aug 2016 11:40
Published Version: http://dx.doi.org/10.1038/ncomms1733
Status: Published
Publisher: Nature Publishing Group
Refereed: Yes
Identification Number: https://doi.org/10.1038/ncomms1733
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