Cross sectional TEM analysis of duplex HIPIMS and DC magnetron sputtered Mo and W doped carbon coatings

Sharp, J., Muller, I.C., Mandal, P. et al. (5 more authors) (2015) Cross sectional TEM analysis of duplex HIPIMS and DC magnetron sputtered Mo and W doped carbon coatings. In: Journal of Physics: Conference Series. Electron Microscopy and Analysis Group Conference (EMAG2015), 29 June to 2 July 2015, Manchester, UK. IOP .

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Copyright, Publisher and Additional Information: Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence (https://creativecommons.org/licenses/by/3.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Dates:
  • Published: 2015
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Materials Science and Engineering (Sheffield)
Funding Information:
FunderGrant number
ENGINEERING AND PHYSICAL SCIENCE RESEARCH COUNCIL (EPSRC)EP/L025213/1
Depositing User: Symplectic Sheffield
Date Deposited: 19 Sep 2016 13:03
Last Modified: 19 Sep 2016 13:03
Published Version: http://dx.doi.org/10.1088/1742-6596/644/1/012011
Status: Published
Publisher: IOP
Refereed: Yes
Identification Number: https://doi.org/10.1088/1742-6596/644/1/012011
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