X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in gamma-Al2O3

Thompson, PBJ, Nguyen, BN, Nicholls, R et al. (9 more authors) (2015) X-ray spectroscopy for chemistry in the 2-4 keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in gamma-Al2O3. Journal of Synchrotron Radiation, 22. 1426 - 1439. ISSN 0909-0495

Abstract

Metadata

Authors/Creators:
  • Thompson, PBJ
  • Nguyen, BN
  • Nicholls, R
  • Bourne, RA
  • Brazier, JB
  • Lovelock, KRJ
  • Brown, SD
  • Wermeille, D
  • Bikondoa, O
  • Lucas, CA
  • Hase, TPA
  • Newton, MA
Copyright, Publisher and Additional Information: © 201f, International Union of Crystallography. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Low-energy X-ray absorption spectroscopy; in situ spectroscopy; catalysts; ionic liquids
Dates:
  • Published: November 2015
  • Accepted: 28 August 2015
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Particle Science and Engineering (Leeds)
The University of Leeds > Faculty of Maths and Physical Sciences (Leeds) > School of Chemistry (Leeds) > Organic Chemistry (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 06 Jan 2016 12:15
Last Modified: 06 Jan 2016 12:15
Published Version: http://dx.doi.org/10.1107/S1600577515016148
Status: Published
Publisher: International Union of Crystallography
Identification Number: https://doi.org/10.1107/S1600577515016148
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