Simple technique for high-throughput marking of distinguishable

Henrichs, L, Chen, L and Bell, A (2016) Simple technique for high-throughput marking of distinguishable. Journal of Microscopy, 262 (1). pp. 28-32. ISSN 0022-2720

Abstract

Metadata

Authors/Creators:
  • Henrichs, L
  • Chen, L
  • Bell, A
Copyright, Publisher and Additional Information: (c) 2015 The Authors, Journal of Microscopy (c)2015 Royal Microscopical Society. This is the peer reviewed version of the following article: Henrichs, L, Chen, L and Bell, A (2015) Simple technique for high-throughput marking of distinguishable. Journal of Microscopy, which has been published in final form at http://dx.doi.org/10.1111/jmi.12337. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving
Keywords: Batch processing, beam, focused ion-beam, focused ion, high-throughput, marking, microscopy, nanotechnology, PFM, sample preparation, SEM, TEM grid
Dates:
  • Published: 17 March 2016
  • Accepted: 20 September 2015
  • Published (online): 9 November 2015
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Chemical & Process Engineering (Leeds) > Institute for Materials Research (Leeds)
The University of Leeds > Faculty of Engineering (Leeds) > School of Electronic & Electrical Engineering (Leeds) > Pollard Institute (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 11 Dec 2015 15:18
Last Modified: 16 Nov 2016 12:09
Published Version: http://dx.doi.org/10.1111/jmi.12337
Status: Published
Publisher: Wiley
Identification Number: https://doi.org/10.1111/jmi.12337

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