Probing the sensitivity of electron wave interference to disorder-induced scattering in solid-state devices

Scannell, B.C., Pilgrim, I., See, A.M. et al. (11 more authors) (2012) Probing the sensitivity of electron wave interference to disorder-induced scattering in solid-state devices. Physical Review B , 85. 195319 . ISSN 1098-0121

Abstract

Metadata

Authors/Creators:
  • Scannell, B.C.
  • Pilgrim, I.
  • See, A.M.
  • Montgomery, R.D.
  • Morse, P.K.
  • Fairbanks, M.S.
  • Marlow, C.A.
  • Linke, H.
  • Farrer, I.
  • Ritchie, D.A.
  • Hamilton, A.R.
  • Micolich, A.P.
  • Eaves, L.
  • Taylor, R.P.
Copyright, Publisher and Additional Information: © 2012 American Physical Society. This is an author produced version of a paper subsequently published in Physical Review B. Uploaded in accordance with the publisher's self-archiving policy.
Dates:
  • Published: 22 May 2012
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Engineering (Sheffield) > Department of Electronic and Electrical Engineering (Sheffield)
Depositing User: Symplectic Sheffield
Date Deposited: 17 Jul 2015 10:43
Last Modified: 29 Mar 2018 03:07
Published Version: http://dx.doi.org/10.1103/PhysRevB.85.195319
Status: Published
Publisher: American Physical Society
Refereed: Yes
Identification Number: https://doi.org/10.1103/PhysRevB.85.195319
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