White Rose University Consortium logo
University of Leeds logo University of Sheffield logo York University logo

Composition depth profiling of polystyrene/poly(vinyl ethyl ether) blend thin films by angle resolved XPS

Beamson, G., Mokarian-Tabari, P. and Geoghegan, M. (2009) Composition depth profiling of polystyrene/poly(vinyl ethyl ether) blend thin films by angle resolved XPS. Journal of Electron Spectroscopy and Related Phenomena, 171 (1-3). pp. 57-63. ISSN 0368-2048

Full text available as:
[img]
Preview
Text
Geoghegan_Composition.pdf

Download (1055Kb)

Abstract

Angle resolved XPS (ARXPS) and scanning force microscopy (SFM) are used to study polystyrene/poly(vinyl ethyl ether) 50/50 wt% blend thin films spin cast from toluene solution, as a function of polystyrene molecular weight and film thickness. ARXPS is used to investigate the composition depth profile (CDP) of the blend thin films and SFM to study their surface morphology and miscibility. The CDPs are modelled by an empirical hyperbolic tangent function with three floating parameters. These are determined by non-linear least squares regression, their uncertainties estimated and the curve fit residuals analysed to demonstrate that the hyperbolic tangent CDP is a satisfactory fit to the ARXPS data. Conclusions are drawn regarding the behaviour of the blend thin films as the thickness and polystyrene molecular weight are varied. Flory-Huggins interaction parameters (chi) for the mixtures are calculated based upon the segregation data, and suggest a value of chi = 0.05 to be appropriate for this system. (c) 2009 Elsevier B.V. All rights reserved.

Item Type: Article
Copyright, Publisher and Additional Information: © 2009 Elsevier. This is an author produced version of a paper subsequently published in Journal of Electron Spectroscopy and Related Phenomena. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Polystyrene; Poly(vinyl ethyl ether); Thin film polymer blend; Angle resolved XPS; Scanning force microscopy; Composition depth profile
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Miss Anthea Tucker
Date Deposited: 29 Jun 2009 13:34
Last Modified: 08 Feb 2013 16:58
Published Version: http://dx.doi.org/10.1016/j.elspec.2009.02.017
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: 10.1016/j.elspec.2009.02.017
URI: http://eprints.whiterose.ac.uk/id/eprint/8712

Actions (login required)

View Item View Item