Composition depth profiling of polystyrene/poly(vinyl ethyl ether) blend thin films by angle resolved XPS

Beamson, G., Mokarian-Tabari, P. and Geoghegan, M. (2009) Composition depth profiling of polystyrene/poly(vinyl ethyl ether) blend thin films by angle resolved XPS. Journal of Electron Spectroscopy and Related Phenomena, 171 (1-3). pp. 57-63. ISSN 0368-2048

Abstract

Metadata

Authors/Creators:
  • Beamson, G.
  • Mokarian-Tabari, P.
  • Geoghegan, M. (Mark.Geoghegan@sheffield.ac.uk)
Copyright, Publisher and Additional Information: © 2009 Elsevier. This is an author produced version of a paper subsequently published in Journal of Electron Spectroscopy and Related Phenomena. Uploaded in accordance with the publisher's self-archiving policy.
Keywords: Polystyrene; Poly(vinyl ethyl ether); Thin film polymer blend; Angle resolved XPS; Scanning force microscopy; Composition depth profile
Institution: The University of Sheffield
Academic Units: The University of Sheffield > Faculty of Science (Sheffield) > Department of Physics and Astronomy (Sheffield)
Depositing User: Miss Anthea Tucker
Date Deposited: 29 Jun 2009 13:34
Last Modified: 08 Feb 2013 16:58
Published Version: http://dx.doi.org/10.1016/j.elspec.2009.02.017
Status: Published
Publisher: Elsevier
Refereed: Yes
Identification Number: 10.1016/j.elspec.2009.02.017

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Filename: Geoghegan_Composition.pdf

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