Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells

Jarrett, R, Dawson, D, Roelich, K et al. (1 more author) (2014) Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells. In: Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th. 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 3-18 Jun 2014 , Denver, Colorado. Institute of Electrical and Electronics Engineers , 1436 - 1441. ISBN 9781479943982

Abstract

Metadata

Authors/Creators:
  • Jarrett, R
  • Dawson, D
  • Roelich, K
  • Purnell, P
Keywords: Criticality; silver nanowire; supply risk; thin film; transparent conductive electrode
Dates:
  • Published: 2014
Institution: The University of Leeds
Academic Units: The University of Leeds > Faculty of Engineering (Leeds) > School of Civil Engineering (Leeds) > Institute for Resilient Infrastructure (Leeds)
Depositing User: Symplectic Publications
Date Deposited: 27 Mar 2015 10:26
Last Modified: 27 Mar 2015 10:34
Published Version: http://dx.doi.org/10.1109/PVSC.2014.6925186
Status: Published
Publisher: Institute of Electrical and Electronics Engineers
Identification Number: https://doi.org/10.1109/PVSC.2014.6925186

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